Beam Instrumentation

(return)

Below is the list of instrumentation devices (being completed):

1. Particle counters used for low current measurement during slow extraction (combination of Secondary Emission detectors, scintillators and Ionisation Chambers installed on movable insert). (PC)

2. Standalone SEM detectors. (SEM)

3. Scintillation screens used for transverse beam profilemeasurements. (SCR)

4. Profile grids. (PG)

5. Trafos (for fast extraction). (BCT)

6. Cryogenic current comparator (CCT).

7. Halo detectors (based on scintillators). (HD)

8. Beam Loss Monitors. (BLM)

A list of HEST BI instruments from RoFi (March 2018): SDdiagnose_list_RoFi__V0.2.xlsx (name changed wrt original file).

List (partial) of Diagnose Kammern:

=== Photos ===

GHADDK4: